Blockchain Architecture Reliability-Based Measurement for Circuit Unit Importance

【Author】 Xiao, Jie; Lou, Jungang; Jiang, Jianhui; Li, Xiaoxin; Yang, Xuhua; Huang, Yujiao

【Source】IEEE ACCESS

【影响因子】3.476

【Abstract】Currently, few works focus on the reliability of the blockchain architecture at the circuit level, which makes its security and privacy vulnerable to hardware errors. To mitigate the hazard, through an iterative probabilistic transfer matrix model coded by a binary-decimal mechanism, a reliability-based evaluation method for the importance of circuit units is proposed in this paper. First, the method calculates the output reliabilities in any leads by the iterative probabilistic transfer matrix model and obtains the reliability gradient for the circuit units based on the gradient and barrel theory. Second, it sorts the importance of the circuit units based on their obtained reliability gradients. Third, combining the sensitized path coverage rate and the sequence comparison, the method constructs an importance-based sorting algorithm for the circuit units with the same reliability gradients. Finally, it reinforces the importance circuit units based on the sorting results to improve the security and privacy for the blockchain architecture at the hardware level. Theoretical analysis and experimental results indicate that the proposed method can be applied to measure the importance of circuit units at several abstract levels, with high precision and small time-space complexity, and systems can thus achieve a great reliability improvement at a small cost.

【Keywords】Blockchain architecture reliability; hardware-level; reliability gradient; circuit unit; importance measurement

【发表时间】2018

【收录时间】2022-01-02

【文献类型】

【主题类别】

--